標題: A novel AOI system for OLED panel inspection
作者: Perng, D. B.
Chen, Y. C.
Lee, M. K.
工業工程與管理學系
Department of Industrial Engineering and Management
公開日期: 2005
摘要: Organic light emitting diode (OLED) technology uses substances that emit red, green, blue or white light. An OLED panel consists of stacks of several thin layers of different materials, as such it is not easy to inspect the common OLED defects. In this paper, an auto-optical inspection (AOI) system which can detect such defects effectively and robustly was proposed and developed. The proposed system can also identify, in which layer the defect occurred. Meanwhile, a moving mechanism coupled with a lighting mechanism was proposed and implemented for gabbing clear images. The proposed AOI system would provide great help in improving the OLED production process and the quality control process.
URI: http://hdl.handle.net/11536/17846
http://dx.doi.org/10.1088/1742-6596/13/1/081
ISSN: 1742-6588
DOI: 10.1088/1742-6596/13/1/081
期刊: 7th International Symposium on Measurement Technology and Intelligent Instruments
Volume: 13
起始頁: 353
結束頁: 356
顯示於類別:會議論文


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