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dc.contributor.authorYEN, TYen_US
dc.contributor.authorCHOU, CPen_US
dc.date.accessioned2014-12-08T15:03:14Z-
dc.date.available2014-12-08T15:03:14Z-
dc.date.issued1995-08-01en_US
dc.identifier.issn0038-1098en_US
dc.identifier.urihttp://hdl.handle.net/11536/1786-
dc.description.abstractCarbon Nitride films have been grown on nickel substrates by magnetically rotated arc-plasma jet chemical vapor deposition (CVD). These films were characterized by scanning electron microscopy (SEM), wavelength dispersive X-ray spectrometry (WDS) transmission electron microscopy (TEM), and Raman spectroscopy. Small grains (similar to 0.1 mu m) as well as nanocrystallites found in the films were identified to be beta-C3N4. Raman spectrum also confirmed the existence of beta-C3N4 phase in the films through three pronounced Raman bands at low frequency as expected from the Hooke's law approximation.en_US
dc.language.isoen_USen_US
dc.subjectTHIN FILMSen_US
dc.subjectCHEMICAL SYNTHESISen_US
dc.subjectSCANNING AND TRANSMISSION ELECTRON MICROSCOPYen_US
dc.subjectINELASTIC LIGHT SCATTERINGen_US
dc.titleSYNTHESIS OF CARBON NITRIDE FILMS BY MAGNETICALLY ROTATED ARC-PLASMA JET CHEMICAL-VAPOR-DEPOSITIONen_US
dc.typeArticleen_US
dc.identifier.journalSOLID STATE COMMUNICATIONSen_US
dc.citation.volume95en_US
dc.citation.issue5en_US
dc.citation.spage281en_US
dc.citation.epage286en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department機械工程學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Mechanical Engineeringen_US
dc.identifier.wosnumberWOS:A1995RE08600004-
dc.citation.woscount63-
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