標題: On the Analysis of Combined Synchronization Error Effects in OFDM Systems
作者: Chin, Wen-Long
Chen, Sau-Gee
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2009
摘要: This work analyzes combined effects of major synchronization errors, including the symbol time offset (STO), carrier frequency offset (CFO) and sampling clock frequency offset (SCFO) of orthogonal frequency-division multiplexing (OFDM) systems. Such errors degrade the performance of an OFDM receiver by introducing inter-carrier interference (ICI) and inter-symbol interference (ISI) into the systems. Traditionally, designing an OFDM receiver needs plenty of Monte Carlo simulations because the synchronization errors are simultaneously inevitable in practical environments. Therefore, we formulate the theoretical signal-to-interference-and-noise ratio (SINR) to assist the design of OFDM receivers. By knowing the required SINR of specific application, all combinations of allowable errors can be derived. Then, cost-effective algorithms could be easily designed.
URI: http://hdl.handle.net/11536/17903
ISBN: 978-1-4244-2516-7
ISSN: 1550-2252
期刊: 2009 IEEE VEHICULAR TECHNOLOGY CONFERENCE, VOLS 1-5
起始頁: 1824
結束頁: 1828
顯示於類別:會議論文