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dc.contributor.authorWang, Yu-Wuen_US
dc.contributor.authorCheng, Horng-Longen_US
dc.contributor.authorWang, Yi-Kaien_US
dc.contributor.authorHu, Tang-Hsiangen_US
dc.contributor.authorHo, Jia-Chongen_US
dc.contributor.authorLee, Cheng-Chungen_US
dc.contributor.authorLei, Tan-Fuen_US
dc.contributor.authorYeh, Ching-Faen_US
dc.date.accessioned2014-12-08T15:25:30Z-
dc.date.available2014-12-08T15:25:30Z-
dc.date.issued2005en_US
dc.identifier.isbn978-957-28522-2-4en_US
dc.identifier.urihttp://hdl.handle.net/11536/17907-
dc.description.abstractThis investigation addresses the electrical properties of pentacene-based thin film transistors in air, dry air and high vacuum. A potential barrier model was applied to explain the gate dependent field effect mobility behavior. The results show the trap density in air higher than that in a vacuum.en_US
dc.language.isoen_USen_US
dc.titleAnalysis of pentacene thin film transistors in different atmospheresen_US
dc.typeProceedings Paperen_US
dc.identifier.journalIDMC 05: PROCEEDINGS OF THE INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE 2005en_US
dc.citation.spage520en_US
dc.citation.epage522en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000259399200143-
顯示於類別:會議論文