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dc.contributor.authorYen, CCen_US
dc.contributor.authorJou, JYen_US
dc.date.accessioned2014-12-08T15:25:43Z-
dc.date.available2014-12-08T15:25:43Z-
dc.date.issued2004en_US
dc.identifier.isbn0-7803-8714-7en_US
dc.identifier.issn1552-6674en_US
dc.identifier.urihttp://hdl.handle.net/11536/18142-
dc.description.abstractWe present an effective algorithm to enhance sequential depth computation. The sequential depth plays the most crucial role to the completeness of bounded model checking. Previous work computes the sequential depth by exhaustively searching the state space, which is unable to keep pace with the exponential growth of design complexity. To improve the computation, we develop an efficient approach that takes the branch-and-bound manner. We reduce the search space by applying a partitioning as well as a pruning method. Furthermore, we propose a novel formulation and integrate the techniques of BDDs and SAT solvers to search states that determine the sequential depth. Experimental results show that our approach considerably enhances the performance compared with the results of the previous work.en_US
dc.language.isoen_USen_US
dc.titleEnhancing sequential depth computation with a branch-and-bound algorithmen_US
dc.typeProceedings Paperen_US
dc.identifier.journalNINTH IEEE INTERNATIONAL HIGH-LEVEL DESIGN VALIDATION AND TEST WORKSHOP, PROCEEDINGSen_US
dc.citation.spage3en_US
dc.citation.epage8en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000225923500001-
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