A digital LVDS driver with simultaneous switching noise rejection

Abstract

In this paper, a Digitized LVDS Driver with SSN (Simultaneous switching noise) rejection is proposed, which is fabricated by TSMC 0.18um CMOS technology. First, the power consumption and chip area are greatly decreased due to the design of digitized driver but we suffered the SSN noise. Second, the method which modifies the driver's control signal greatly reduces the ground bounce, and simultaneously solved the ground bound problem mentioned above. Third, the driver can calibrate the output differential mode by the control signal outside the chip by way of the controllable driver. According to the simulation results, ground bounce reduced from 175mV to 95mV, 55% diminished, and the measurement output jitter (pk-pk) is less than 48ps @1.25Gbps. The driver area is only 210um x 210um and power consumption is less than 19mW, which are extremely lower then the conventional LVDS Driver. The proposed programmable driver can also be applied to the 1.5Gbps Serial ATA standard or 2.5Gbps PCI-Express.