標題: ESD protection design for broadband RF circuits with decreasing-size distributed protection scheme
作者: Ker, MD
Kuo, BJ
電機學院
College of Electrical and Computer Engineering
關鍵字: electrostatic discharge (ESD);distributed ESD (DESD);coplanar waveguide;broadband RF circuits
公開日期: 2004
摘要: The resulting capacitive load, from the large electrostatic discharge (ESD) protection device for high ESD robustness, has an adverse effect on the performance of broadband RF circuits due to the impedance mismatch and bandwidth degradation. The conventional distributed ESD protection scheme using equal four-stage ESD protection can achieve a better impedance match, but degrade the D performance. A new distributed ESD protection structure is proposed in this work to achieve both good ESD robustness and RF performance. The proposed ESD protection circuit is constructed by arranging ESD protection stages with decreasing device size, named decreasing-size distributed ESD (DS-DESD) protection scheme, which is beneficial to the ESD level. The experimental results had shown the human-body-model (HBM) ESD robustness of up to 8kV.
URI: http://hdl.handle.net/11536/18224
ISBN: 0-7803-8333-8
ISSN: 1529-2517
期刊: 2004 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS
起始頁: 383
結束頁: 386
顯示於類別:會議論文