AN OPTIMAL ALGORITHM FOR FINDING THE MOST VITAL EDGE WITH RESPECT TO SKT RELIABILITY IN BSP DIGRAPHS

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	WANG, PF	en_US
dc.contributor.author	LEU, SC	en_US
dc.contributor.author	HSU, LH	en_US
dc.date.accessioned	2014-12-08T15:03:18Z	-
dc.date.available	2014-12-08T15:03:18Z	-
dc.date.issued	1995-07-01	en_US
dc.identifier.issn	0253-3839	en_US
dc.identifier.uri	http://hdl.handle.net/11536/1848	-
dc.description.abstract	The SKT reliability is the probability that a source can send communication to a specified set of terminals K in V in a probabilistic digraph D = (V, E). ''The most vital edge'' is the edge whose deletion yields the largest decrease in the SKT reliability. A digraph is a basically-series-parallel(BSP) directed graph if its underlying undirected graph is series-parallel. In this paper, we propose a tree-like structure and present an optimal algorithm with linear time complexity for finding the most vital edge with respect to SKT reliability in BSP digraphs.	en_US
dc.language.iso	en_US	en_US
dc.subject	OPTIMAL ALGORITHM	en_US
dc.subject	BASIC-SERIES-PARALLEL DIGRAPHS	en_US
dc.subject	MOST VITAL EDGE	en_US
dc.subject	NETWORK RELIABILITY	en_US
dc.title	AN OPTIMAL ALGORITHM FOR FINDING THE MOST VITAL EDGE WITH RESPECT TO SKT RELIABILITY IN BSP DIGRAPHS	en_US
dc.type	Article	en_US
dc.identifier.journal	JOURNAL OF THE CHINESE INSTITUTE OF ENGINEERS	en_US
dc.citation.volume	18	en_US
dc.citation.issue	4	en_US
dc.citation.spage	519	en_US
dc.citation.epage	529	en_US
dc.contributor.department	資訊工程學系	zh_TW
dc.contributor.department	Department of Computer Science	en_US
dc.identifier.wosnumber	WOS:A1995RZ37900007	-
dc.citation.woscount	0	-
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