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dc.contributor.authorLee, HCen_US
dc.contributor.authorSun, KWen_US
dc.contributor.authorLee, CPen_US
dc.date.accessioned2014-12-08T15:26:06Z-
dc.date.available2014-12-08T15:26:06Z-
dc.date.issued2003en_US
dc.identifier.isbn0-8194-4824-9en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/18505-
dc.identifier.urihttp://dx.doi.org/10.1117/12.513765en_US
dc.description.abstractBased on the dielectric continuum model, we have studied the dependence of electron-optical phonon scattering rates in GaAs/AlxGa1-xAs quantum wells with different structure parameters. It was found that the dependence of scattering rates of symmetric interface mode on Al composition in the barrier was stronger than that of the confined mode. The average phonon energy emitted by hot electrons in GaAs/AlxGa1-xAs quantum wells with various Al composition was estimated and the calculated value agrees with the experimental results qualitatively. For the dependence on the well width, scattering rates of the S+ mode dropped considerably as the well width is increased. The hot electron-neutral acceptor luminescence spectrum of the strained InxGa1-xAs/GaAs quantum well sample shows an oscillation period of about 22 meV which indicates that the hot electrons relaxed mostly through emissions of the InAs confined phonons.en_US
dc.language.isoen_USen_US
dc.subjectquantum wellsen_US
dc.subjectoptical phononen_US
dc.subjectinter-subband scatteringen_US
dc.subjecthot electronen_US
dc.subjectneutral acceptoren_US
dc.titleStructure effects on inter- and intra-band scattering of electrons in GaAs/AlxGa1-xAs and strained InxGa1-xAs/GaAs quantum wellsen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.513765en_US
dc.identifier.journal10TH INTERNATIONAL SYMPOSIUM ON NANOSTRUCTURES: PHYSICS AND TECHNOLOGYen_US
dc.citation.volume5023en_US
dc.citation.spage204en_US
dc.citation.epage208en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000184080700054-
Appears in Collections:Conferences Paper


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