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dc.contributor.authorCHU, LHen_US
dc.contributor.authorCHEN, YFen_US
dc.contributor.authorCHANG, DCen_US
dc.contributor.authorCHANG, CYen_US
dc.date.accessioned2014-12-08T15:03:19Z-
dc.date.available2014-12-08T15:03:19Z-
dc.date.issued1995-06-05en_US
dc.identifier.issn0953-8984en_US
dc.identifier.urihttp://dx.doi.org/10.1088/0953-8984/7/23/021en_US
dc.identifier.urihttp://hdl.handle.net/11536/1861-
dc.description.abstractThe long-term relaxation and build-up transient of photoconductivity has been observed in Si1-xGex/Si quantum wells. The long-term relaxation behaviour pelt) of photoconductivity can be described by a stretched-exponential function, I-pc(t) = I-pc(0) exp[-(t/tau)(beta)] (0<i beta <1) for T < 160 K, which is usually observed in a wide class of disordered materials. The long-term build-up transient of photoconductivity has been measured and formulated at different temperatures, which also indicates the existence of the band-tail states due to alloy disorder. The distribution of tail states has been confirmed to be exponential in energy. Our results suggest that the alloy potential fluctuations induced by compositional fluctuations can strongly influence the transport as well as optical properties of Si1-xGex/Si quantum wells.en_US
dc.language.isoen_USen_US
dc.titleTHE LONG-TERM RELAXATION AND BUILDUP TRANSIENT OF PHOTOCONDUCTIVITY IN SI1-XGEX/SI QUANTUM-WELLSen_US
dc.typeArticleen_US
dc.identifier.doi10.1088/0953-8984/7/23/021en_US
dc.identifier.journalJOURNAL OF PHYSICS-CONDENSED MATTERen_US
dc.citation.volume7en_US
dc.citation.issue23en_US
dc.citation.spage4525en_US
dc.citation.epage4532en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1995RC23600021-
dc.citation.woscount14-
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