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| A novel method to characterize the dielectric and interfacial properties of Ba0.5Sr0.5TiO3 (BST)/Si by microwave measurement | 102 |
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| A novel method to characterize the dielectric and interfacial properties of Ba0.5Sr0.5TiO3 (BST)/Si by microwave measurement | 102 |
| 檢視 |
|---|
| 檢視 | |
|---|---|
| 中國 | 94 |
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| Shenzhen | 93 |
| Menlo Park | 4 |
| Kensington | 3 |
| Beijing | 1 |