Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shye, DC | en_US |
dc.contributor.author | Chiou, BS | en_US |
dc.contributor.author | Hwang, CC | en_US |
dc.contributor.author | Chen, JS | en_US |
dc.contributor.author | Su, IW | en_US |
dc.contributor.author | Chou, CC | en_US |
dc.contributor.author | Cheng, HC | en_US |
dc.date.accessioned | 2014-12-08T15:26:34Z | - |
dc.date.available | 2014-12-08T15:26:34Z | - |
dc.date.issued | 2002 | en_US |
dc.identifier.isbn | 0-7803-7414-2 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/18857 | - |
dc.description.abstract | Thin (Ba0.5Sr0.5)TiO3 (BST) films were sputtered on Pt[FiN/Ti/Si multilayer substrates at very low temperature (150degrees C). A novel process, using wavelength 248-nm KrF excimer laser annealing (ELA), has been undertaken to implement barium strontium titanate (BST) films at a low process temperature of 300degrees C. The crystallinity and dielectric constant are greatly improved after ELA treatment. In this work, the variation of texture was investigated. Besides, the escaped oxygen atoms from BST films were detected in-situ using a residual gas analyzer (RGA) during ELA process. Thus, the degradation of upper surface is strongly influenced by the laser energy fluence for an ELA-BST film. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | excimer laser annealing | en_US |
dc.subject | low temperature | en_US |
dc.subject | texture | en_US |
dc.subject | residual gas analyzer (RGA) | en_US |
dc.title | Characteristics of low-temperature-prepared (Ba, Sr)TiO3 films post treated by novel excimer laser annealing | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | ISAF 2002: PROCEEDINGS OF THE 13TH IEEE INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS | en_US |
dc.citation.spage | 227 | en_US |
dc.citation.epage | 230 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000183375500056 | - |
Appears in Collections: | Conferences Paper |