Analytical evaluation of MoM matrix elements for the capacitance of microstrip discontinuities

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DC 欄位	值	語言
dc.contributor.author	Su, KY	en_US
dc.contributor.author	Kuo, JT	en_US
dc.date.accessioned	2014-12-08T15:26:49Z	-
dc.date.available	2014-12-08T15:26:49Z	-
dc.date.issued	2001	en_US
dc.identifier.isbn	0-7803-7138-0	en_US
dc.identifier.uri	http://hdl.handle.net/11536/19069	-
dc.description.abstract	An analytical integration formula is derived for the four-fold integral involved in analyzing microstrip discontinuities by the Galerkin's method of moments (MoM). The conductors can be discretized into rectangular subsections with arbitrary dimensions. Application of this newly derived formula to the analysis of some microstrip discontinuities shows that the calculated results have a good convergent behavior. Some results for microstrip open-ends and series gaps are presented.	en_US
dc.language.iso	en_US	en_US
dc.title	Analytical evaluation of MoM matrix elements for the capacitance of microstrip discontinuities	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	APMC 2001: ASIA-PACIFIC MICROWAVE CONFERENCE, VOLS 1-3, PROCEEDINGS	en_US
dc.citation.spage	445	en_US
dc.citation.epage	448	en_US
dc.contributor.department	資訊工程學系	zh_TW
dc.contributor.department	Department of Computer Science	en_US
dc.identifier.wosnumber	WOS:000177768600106	-
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