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dc.contributor.authorLiu, CNJen_US
dc.contributor.authorChang, CYen_US
dc.contributor.authorJou, JYen_US
dc.contributor.authorLai, MCen_US
dc.contributor.authorJuan, HMen_US
dc.date.accessioned2014-12-08T15:26:58Z-
dc.date.available2014-12-08T15:26:58Z-
dc.date.issued2000en_US
dc.identifier.urihttp://hdl.handle.net/11536/19197-
dc.description.abstractWhile the coverage-driven functional verification is getting popular: a fast and convenient coverage measurement tool is necessary. In this paper, we propose a hovel approach for functional coverage measurement based on the VCD files produced by the simulators. The usage flow of the proposed dumpfile-based coverage analysis is much easier and smoother than that of existing instrumentation-based coverage tools. No pre-processing tool is required and no extra code will be inserted into the source code. Most importantly, the flexibility in choosing coverage metrics and measured code regions is increased. Only one simulation run is needed for any kind of coverage reports. By conducting some experiments on real examples: it shows very promising results in terms of the performance and the accuracy of coverage reports.en_US
dc.language.isoen_USen_US
dc.titleA novel approach for functional coverage measurement in HDLen_US
dc.typeProceedings Paperen_US
dc.identifier.journalISCAS 2000: IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS - PROCEEDINGS, VOL IV: EMERGING TECHNOLOGIES FOR THE 21ST CENTURYen_US
dc.citation.spage217en_US
dc.citation.epage220en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000088844700055-
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