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dc.contributor.authorTaon, SYen_US
dc.contributor.authorHsieh, TEen_US
dc.contributor.authorShieh, HPDen_US
dc.date.accessioned2014-12-08T15:26:58Z-
dc.date.available2014-12-08T15:26:58Z-
dc.date.issued2000en_US
dc.identifier.isbn0-8194-3720-4en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/19209-
dc.description.abstractWe propose a new laser lithography technique using the effect of thermal-induced super resolution and demonstrate that the technique can effectively reduce the exposed spot size on the photoresist layer, thus allowing disk mastering toward higher density by using exiting light source and optics. A mask layer, whose nonlinear optical properties result in formation an aperture in high temperature area near to the center of the laser spot, is deposited on the top of the photoresist layer. Usually, the aperture size is much smaller than the laser spot, thus, achieving thermal-induced super resolution. The simulation and experimental results reveal that the line width on the photoresist layer could be shrunk by more than 40%.en_US
dc.language.isoen_USen_US
dc.subjectdisk masteringen_US
dc.subjectthermal-induced super resolutionen_US
dc.subjectlithographyen_US
dc.titleOptical disk mastering using optical super resolution effecten_US
dc.typeProceedings Paperen_US
dc.identifier.journalOPTICAL STORAGE AND OPTICAL INFORMATION PROCESSINGen_US
dc.citation.volume4081en_US
dc.citation.spage95en_US
dc.citation.epage102en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000089915700013-
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