完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Taon, SY | en_US |
dc.contributor.author | Hsieh, TE | en_US |
dc.contributor.author | Shieh, HPD | en_US |
dc.date.accessioned | 2014-12-08T15:26:58Z | - |
dc.date.available | 2014-12-08T15:26:58Z | - |
dc.date.issued | 2000 | en_US |
dc.identifier.isbn | 0-8194-3720-4 | en_US |
dc.identifier.issn | 0277-786X | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/19209 | - |
dc.description.abstract | We propose a new laser lithography technique using the effect of thermal-induced super resolution and demonstrate that the technique can effectively reduce the exposed spot size on the photoresist layer, thus allowing disk mastering toward higher density by using exiting light source and optics. A mask layer, whose nonlinear optical properties result in formation an aperture in high temperature area near to the center of the laser spot, is deposited on the top of the photoresist layer. Usually, the aperture size is much smaller than the laser spot, thus, achieving thermal-induced super resolution. The simulation and experimental results reveal that the line width on the photoresist layer could be shrunk by more than 40%. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | disk mastering | en_US |
dc.subject | thermal-induced super resolution | en_US |
dc.subject | lithography | en_US |
dc.title | Optical disk mastering using optical super resolution effect | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | OPTICAL STORAGE AND OPTICAL INFORMATION PROCESSING | en_US |
dc.citation.volume | 4081 | en_US |
dc.citation.spage | 95 | en_US |
dc.citation.epage | 102 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:000089915700013 | - |
顯示於類別: | 會議論文 |