統計資料
總造訪次數
| 檢視 | |
|---|---|
| Plasma process induced damage in sputtered TiN metal gate capacitors with ultra-thin nitrided oxide | 113 |
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| 000166707200033.pdf | 4 |
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| 檢視 | |
|---|---|
| Plasma process induced damage in sputtered TiN metal gate capacitors with ultra-thin nitrided oxide | 113 |
| 檢視 | |
|---|---|
| 000166707200033.pdf | 4 |
| 檢視 | |
|---|---|
| 中國 | 98 |
| 美國 | 15 |
| 檢視 | |
|---|---|
| Shenzhen | 96 |
| Menlo Park | 9 |
| Kensington | 5 |
| Beijing | 2 |
| Edmond | 1 |