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dc.contributor.authorCHEN, RCen_US
dc.contributor.authorWU, JPen_US
dc.contributor.authorCHU, HSen_US
dc.date.accessioned2014-12-08T15:03:24Z-
dc.date.available2014-12-08T15:03:24Z-
dc.date.issued1995-05-01en_US
dc.identifier.issn0022-1481en_US
dc.identifier.urihttp://hdl.handle.net/11536/1954-
dc.description.abstractThis work presents a thermal analysis on predicting the temperature increase and the voltage response of high-T-c superconducting bolometers. Two heat transfer models, that is, the surface heating model and the heat generation model considering the skin depth, are introduced and compared. The surface heating model is found to be valid only for situations where the skin depth is much smaller than the film thickness. To consider the thermal boundary resistance between film and substrate, a radiation-boundary-condition model based on acoustic mismatch model (AMM) and an interfacial-layer model (ILM) are employed. The thermal boundary resistance significantly influences the voltage response. Additionally, several common substrates are examined. SrTiO3 (100) or LaAlO3 (100) is a better substrate for high-T-c superconducting bolometers. One interesting finding was that when compared with experimental data, all the theoretical values from the present study as well as the other previously theoretical treatment overestimate the voltage response near the transition temperature.en_US
dc.language.isoen_USen_US
dc.subjectCONDUCTIONen_US
dc.subjectELECTRONIC EQUIPMENTen_US
dc.subjectTRANSIENT AND UNSTEADY HEAT TRANSFERen_US
dc.titleBOLOMETRIC RESPONSE OF HIGH-T-C SUPERCONDUCTING DETECTORS TO OPTICAL PULSES AND CONTINUOUS WAVESen_US
dc.typeArticleen_US
dc.identifier.journalJOURNAL OF HEAT TRANSFER-TRANSACTIONS OF THE ASMEen_US
dc.citation.volume117en_US
dc.citation.issue2en_US
dc.citation.spage366en_US
dc.citation.epage372en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department機械工程學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Mechanical Engineeringen_US
dc.identifier.wosnumberWOS:A1995RC94900018-
dc.citation.woscount8-
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