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dc.contributor.authorHu, CWen_US
dc.contributor.authorLee, CLen_US
dc.contributor.authorWu, WCen_US
dc.contributor.authorChen, JEen_US
dc.date.accessioned2014-12-08T15:27:29Z-
dc.date.available2014-12-08T15:27:29Z-
dc.date.issued1997en_US
dc.identifier.isbn0-8186-8209-4en_US
dc.identifier.urihttp://hdl.handle.net/11536/19745-
dc.description.abstractThis paper investigates detection and location for single faults in odd-even sorting networks. In the work, we have found that three tests are enough to locate single link fault and four tests are sufficient to detect single sorting element fault in an odd-even sorting network. For location tests for sorting element faults, the numbers of tests depend on the type of faults occurring at the sorting element. For most types of sorting element faults, the numbers are less than four specific tests. For the other types of faults, we have prevented the test generation procedure and binary search procedures to generate the tests. The numbers of location tests are less than (n+log(2)n), where n=log(2)N and N is the number of inputs of the sorting network.en_US
dc.language.isoen_USen_US
dc.titleFault diagnosis of odd-even sorting networksen_US
dc.typeProceedings Paperen_US
dc.identifier.journalSIXTH ASIAN TEST SYMPOSIUM (ATS'97), PROCEEDINGSen_US
dc.citation.spage288en_US
dc.citation.epage293en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1997BJ93X00047-
Appears in Collections:Conferences Paper