標題: Fault diagnosis of odd-even sorting networks
作者: Hu, CW
Lee, CL
Wu, WC
Chen, JE
交大名義發表
電子工程學系及電子研究所
National Chiao Tung University
Department of Electronics Engineering and Institute of Electronics
公開日期: 1997
摘要: This paper investigates detection and location for single faults in odd-even sorting networks. In the work, we have found that three tests are enough to locate single link fault and four tests are sufficient to detect single sorting element fault in an odd-even sorting network. For location tests for sorting element faults, the numbers of tests depend on the type of faults occurring at the sorting element. For most types of sorting element faults, the numbers are less than four specific tests. For the other types of faults, we have prevented the test generation procedure and binary search procedures to generate the tests. The numbers of location tests are less than (n+log(2)n), where n=log(2)N and N is the number of inputs of the sorting network.
URI: http://hdl.handle.net/11536/19745
ISBN: 0-8186-8209-4
期刊: SIXTH ASIAN TEST SYMPOSIUM (ATS'97), PROCEEDINGS
起始頁: 288
結束頁: 293
Appears in Collections:Conferences Paper