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學術出版;;Publications
會議論文;;Conferences Paper
Polycrystalline beta-SiC film growth on Si by ECR-CVD at 178-500 degrees C
Polycrystalline beta-SiC film growth on Si by ECR-CVD at 178-500 degrees C
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Date
1996
Authors
Cheng, KL
Liu, CC
Fu, CM
Cheng, HC
Lee, C
Yew, TR
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https://ir.lib.nycu.edu.tw/handle/11536/19826
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會議論文;;Conferences Paper
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