完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | CHOW, TC | en_US |
dc.contributor.author | CHOU, H | en_US |
dc.contributor.author | LAI, HG | en_US |
dc.contributor.author | LIU, CC | en_US |
dc.contributor.author | GOU, YS | en_US |
dc.date.accessioned | 2014-12-08T15:03:27Z | - |
dc.date.available | 2014-12-08T15:03:27Z | - |
dc.date.issued | 1995-04-01 | en_US |
dc.identifier.issn | 0921-4534 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/1997 | - |
dc.description.abstract | A Josephson junction with a length of 10 times the Josephson penetration depth (lambda(J)) and a defect size of 0.5 lambda(J) to 2 lambda(J) in different positions has been studied by a mechanical simulation. It was found that the defect modulated the current distribution tremendously when it was near the edge of the junction. A surprising enhancement of the critical current under the field was observed when the defect was located at 0.5 lambda(J) and had a size from 0.5 lambda(J) to 2 lambda(J), which was much larger than the conventional pinning size: the coherent length xi. This effect could be attributed to a self-field, which was either generated by the current itself or by the applied magnetic field, penetrating into the defect smoothly and being pinned at the defect. A repulsive interaction between the self-field and the external field kept any further flux from abruptly penetrating into the junction. The increment in the critical current under the applied field was up to 125% of the original defect-free one. By fitting two defects of the same size of 2 lambda(J) and positioning them at 0.5 lambda(J) to both edges of the junction, the zero field critical current and the critical magnetic field were enhanced up to 150% of a defect-free junction. | en_US |
dc.language.iso | en_US | en_US |
dc.title | ENHANCEMENT OF CRITICAL-CURRENT AND MAGNETIC-FIELD IN A DEFECTED JOSEPHSON TUNNELING JUNCTION | en_US |
dc.type | Article | en_US |
dc.identifier.journal | PHYSICA C | en_US |
dc.citation.volume | 245 | en_US |
dc.citation.issue | 1-2 | en_US |
dc.citation.spage | 143 | en_US |
dc.citation.epage | 150 | en_US |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.identifier.wosnumber | WOS:A1995QU31000018 | - |
dc.citation.woscount | 3 | - |
顯示於類別: | 期刊論文 |