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dc.contributor.authorCHOW, TCen_US
dc.contributor.authorCHOU, Hen_US
dc.contributor.authorLAI, HGen_US
dc.contributor.authorLIU, CCen_US
dc.contributor.authorGOU, YSen_US
dc.date.accessioned2014-12-08T15:03:27Z-
dc.date.available2014-12-08T15:03:27Z-
dc.date.issued1995-04-01en_US
dc.identifier.issn0921-4534en_US
dc.identifier.urihttp://hdl.handle.net/11536/1997-
dc.description.abstractA Josephson junction with a length of 10 times the Josephson penetration depth (lambda(J)) and a defect size of 0.5 lambda(J) to 2 lambda(J) in different positions has been studied by a mechanical simulation. It was found that the defect modulated the current distribution tremendously when it was near the edge of the junction. A surprising enhancement of the critical current under the field was observed when the defect was located at 0.5 lambda(J) and had a size from 0.5 lambda(J) to 2 lambda(J), which was much larger than the conventional pinning size: the coherent length xi. This effect could be attributed to a self-field, which was either generated by the current itself or by the applied magnetic field, penetrating into the defect smoothly and being pinned at the defect. A repulsive interaction between the self-field and the external field kept any further flux from abruptly penetrating into the junction. The increment in the critical current under the applied field was up to 125% of the original defect-free one. By fitting two defects of the same size of 2 lambda(J) and positioning them at 0.5 lambda(J) to both edges of the junction, the zero field critical current and the critical magnetic field were enhanced up to 150% of a defect-free junction.en_US
dc.language.isoen_USen_US
dc.titleENHANCEMENT OF CRITICAL-CURRENT AND MAGNETIC-FIELD IN A DEFECTED JOSEPHSON TUNNELING JUNCTIONen_US
dc.typeArticleen_US
dc.identifier.journalPHYSICA Cen_US
dc.citation.volume245en_US
dc.citation.issue1-2en_US
dc.citation.spage143en_US
dc.citation.epage150en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:A1995QU31000018-
dc.citation.woscount3-
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