DESIGN FOR DIAGNOSABILITY AND DIAGNOSTIC STRATEGIES OF WSI ARRAY ARCHITECTURES

Full metadata record

DC Field	Value	Language
dc.contributor.author	WANG, KC	en_US
dc.contributor.author	TSENG, WD	en_US
dc.date.accessioned	2014-12-08T15:27:51Z	-
dc.date.available	2014-12-08T15:27:51Z	-
dc.date.issued	1994	en_US
dc.identifier.isbn	0-7803-1849-8	en_US
dc.identifier.issn	1063-2204	en_US
dc.identifier.uri	http://hdl.handle.net/11536/20107	-
dc.language.iso	en_US	en_US
dc.title	DESIGN FOR DIAGNOSABILITY AND DIAGNOSTIC STRATEGIES OF WSI ARRAY ARCHITECTURES	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	INTERNATIONAL CONFERENCE ON WAFER SCALE INTEGRATION: IEEE 1994 PROCEEDINGS SIXTH ANNUAL	en_US
dc.citation.spage	208	en_US
dc.citation.epage	217	en_US
dc.contributor.department	資訊工程學系	zh_TW
dc.contributor.department	Department of Computer Science	en_US
dc.identifier.wosnumber	WOS:A1994BA36U00020	-
Appears in Collections:	Conferences Paper