THE ELLIPSOMETRIC MEASUREMENTS ON SIO2 BY INTENSITY RATIO TECHNIQUE

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DC Field	Value	Language
dc.contributor.author	CHAO, YF	en_US
dc.contributor.author	WEI, CS	en_US
dc.contributor.author	LEE, WC	en_US
dc.contributor.author	LIN, SC	en_US
dc.date.accessioned	2014-12-08T15:27:52Z	-
dc.date.available	2014-12-08T15:27:52Z	-
dc.date.issued	1994	en_US
dc.identifier.isbn	0-8194-1589-8	en_US
dc.identifier.uri	http://hdl.handle.net/11536/20125	-
dc.identifier.uri	http://dx.doi.org/10.1117/12.186666	en_US
dc.language.iso	en_US	en_US
dc.subject	ELLIPSOMETRY	en_US
dc.subject	THIN FILM	en_US
dc.title	THE ELLIPSOMETRIC MEASUREMENTS ON SIO2 BY INTENSITY RATIO TECHNIQUE	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.doi	10.1117/12.186666	en_US
dc.identifier.journal	POLARIZATION ANALYSIS AND MEASUREMENT II	en_US
dc.citation.volume	2265	en_US
dc.citation.spage	171	en_US
dc.citation.epage	180	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.identifier.wosnumber	WOS:A1994BB96Z00019	-
Appears in Collections:	Conferences Paper

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