THE ELLIPSOMETRIC MEASUREMENTS ON SIO2 BY INTENSITY RATIO TECHNIQUE

標題:	THE ELLIPSOMETRIC MEASUREMENTS ON SIO2 BY INTENSITY RATIO TECHNIQUE
作者:	CHAO, YF WEI, CS LEE, WC LIN, SC 交大名義發表 National Chiao Tung University
關鍵字:	ELLIPSOMETRY;THIN FILM
公開日期:	1994
URI:	http://hdl.handle.net/11536/20125 http://dx.doi.org/10.1117/12.186666
ISBN:	0-8194-1589-8
DOI:	10.1117/12.186666
期刊:	POLARIZATION ANALYSIS AND MEASUREMENT II
Volume:	2265
起始頁:	171
結束頁:	180
Appears in Collections:	Conferences Paper

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