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dc.contributor.authorWANG, HMen_US
dc.contributor.authorLEE, CLen_US
dc.contributor.authorCHEN, JEen_US
dc.date.accessioned2014-12-08T15:27:53Z-
dc.date.available2014-12-08T15:27:53Z-
dc.date.issued1994en_US
dc.identifier.isbn0-8186-5650-6en_US
dc.identifier.issn0195-623Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/20153-
dc.language.isoen_USen_US
dc.titleCOMPLETE TEST SET FOR MULTIPLE-VALUED LOGIC-NETWORKSen_US
dc.typeProceedings Paperen_US
dc.identifier.journalTWENTY-FOURTH INTERNATIONAL SYMPOSIUM ON MULTIPLE-VALUED LOGIC, PROCEEDINGSen_US
dc.citation.spage289en_US
dc.citation.epage296en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1994BB07F00039-
Appears in Collections:Conferences Paper