COMPLETE TEST SET FOR MULTIPLE-VALUED LOGIC-NETWORKS

Full metadata record

DC Field	Value	Language
dc.contributor.author	WANG, HM	en_US
dc.contributor.author	LEE, CL	en_US
dc.contributor.author	CHEN, JE	en_US
dc.date.accessioned	2014-12-08T15:27:53Z	-
dc.date.available	2014-12-08T15:27:53Z	-
dc.date.issued	1994	en_US
dc.identifier.isbn	0-8186-5650-6	en_US
dc.identifier.issn	0195-623X	en_US
dc.identifier.uri	http://hdl.handle.net/11536/20153	-
dc.language.iso	en_US	en_US
dc.title	COMPLETE TEST SET FOR MULTIPLE-VALUED LOGIC-NETWORKS	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	TWENTY-FOURTH INTERNATIONAL SYMPOSIUM ON MULTIPLE-VALUED LOGIC, PROCEEDINGS	en_US
dc.citation.spage	289	en_US
dc.citation.epage	296	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:A1994BB07F00039	-
Appears in Collections:	Conferences Paper