COMPLETE TEST SET FOR MULTIPLE-VALUED LOGIC-NETWORKS

標題:	COMPLETE TEST SET FOR MULTIPLE-VALUED LOGIC-NETWORKS
作者:	WANG, HM LEE, CL CHEN, JE 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公開日期:	1994
URI:	http://hdl.handle.net/11536/20153
ISBN:	0-8186-5650-6
ISSN:	0195-623X
期刊:	TWENTY-FOURTH INTERNATIONAL SYMPOSIUM ON MULTIPLE-VALUED LOGIC, PROCEEDINGS
起始頁:	289
結束頁:	296
顯示於類別：	會議論文