COMPLETE TEST SET FOR MULTIPLE-VALUED LOGIC-NETWORKS

Title:	COMPLETE TEST SET FOR MULTIPLE-VALUED LOGIC-NETWORKS
Authors:	WANG, HM LEE, CL CHEN, JE 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
Issue Date:	1994
URI:	http://hdl.handle.net/11536/20153
ISBN:	0-8186-5650-6
ISSN:	0195-623X
Journal:	TWENTY-FOURTH INTERNATIONAL SYMPOSIUM ON MULTIPLE-VALUED LOGIC, PROCEEDINGS
Begin Page:	289
End Page:	296
Appears in Collections:	Conferences Paper