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dc.contributor.authorLiao, Yu-Kuangen_US
dc.contributor.authorLin, Woei-Tyngen_US
dc.contributor.authorHsieh, Dan-Huaen_US
dc.contributor.authorKuo, Shou-Yien_US
dc.contributor.authorLai, Fang-Ien_US
dc.contributor.authorChueh, Yu-Lunen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.date.accessioned2014-12-08T15:28:04Z-
dc.date.available2014-12-08T15:28:04Z-
dc.date.issued2012en_US
dc.identifier.isbn978-1-4673-2200-3en_US
dc.identifier.urihttp://hdl.handle.net/11536/20336-
dc.description.abstractIn this study, photoluminescence (PL) measurements were used to characterized Cu(In,Ga)Se-2 nanotip arrays (CIGS NTRs). Large area CIGS NTRs were yielded by using one step Ar+ milling process without template. Formation mechanism of NTRs is due to a highly anisotropic milling effect of the quaternary components compound. In both CIGS thin films with and without NTRs, saturation effects of Donor-Acceptor Pair (DAP) had been observed while excitation power dependence PL measurements. Comparing with thin film CIGS without NTRs, it has revealed that the concentration DAP had been changed after formation of CIGS NTRs and had enhanced its carrier density of the p-type semiconductor.en_US
dc.language.isoen_USen_US
dc.subjectCIGSen_US
dc.subjectnanotipsen_US
dc.subjectphotoluminescenceen_US
dc.subjectsaturationen_US
dc.titleCharacterization of large area Cu(In,Ga)Se-2 nanotip arrays via photoluminescenceen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2012 12TH IEEE CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO)en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000309933900177-
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