完整後設資料紀錄
DC 欄位語言
dc.contributor.authorCHIOU, BSen_US
dc.contributor.authorYOUNG, CDen_US
dc.contributor.authorDUH, JGen_US
dc.date.accessioned2014-12-08T15:03:30Z-
dc.date.available2014-12-08T15:03:30Z-
dc.date.issued1995-03-01en_US
dc.identifier.issn0022-2461en_US
dc.identifier.urihttp://dx.doi.org/10.1007/BF00356134en_US
dc.identifier.urihttp://hdl.handle.net/11536/2034-
dc.description.abstractA 36.8wt % CaO-26.2 wt % TiO2-37.0 wt % SiO2 glass (CTS) was employed as the ceramic brazer for the bonding of 3 mol % yttria stabilized zirconia (YSZ3). Sandwich-like YSZ3-CTS-YSZ3 specimens were fabricated and temperature dependence of the bonding strength was evaluated. An optimum bonding process was achieved at a bonding temperature of 1424 degrees C for 30 min with CTS glass slurry having a glass/organic ratio of 1.82. The effects of processing parameters on the bending was investigated on the basis of the metallurgical evolution at the interface. In addition, predominating factors affecting the bonding strength were also explored.en_US
dc.language.isoen_USen_US
dc.titleLIQUID-PHASE BONDING OF YTTRIA-STABILIZED ZIRCONIA WITH CAO-TIO2-SIO2 GLASSen_US
dc.typeArticleen_US
dc.identifier.doi10.1007/BF00356134en_US
dc.identifier.journalJOURNAL OF MATERIALS SCIENCEen_US
dc.citation.volume30en_US
dc.citation.issue5en_US
dc.citation.spage1295en_US
dc.citation.epage1301en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1995QL40000025-
dc.citation.woscount2-
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