完整後設資料紀錄
DC 欄位語言
dc.contributor.authorHung, Shih-Weien_US
dc.contributor.authorWang, Terry Tai-Juien_US
dc.contributor.authorChu, Li-Weien_US
dc.contributor.authorChen, Lih-Juannen_US
dc.date.accessioned2014-12-08T15:28:09Z-
dc.date.available2014-12-08T15:28:09Z-
dc.date.issued2011-08-11en_US
dc.identifier.issn1932-7447en_US
dc.identifier.urihttp://dx.doi.org/10.1021/jp201395ren_US
dc.identifier.urihttp://hdl.handle.net/11536/20384-
dc.description.abstractSelf-catalyzed growth of FeSi nanowires has been achieved via a spontaneous chemical reaction method. The room-temperature ferromagnetism behavior compared to that of bulk FeSi at 4 K is attributed to the enhancement of magnetic coupling behavior correlated to different crystalline orientations. The resistivity of the single-stem FeSi nanowire was determined to be 2650 mu Omega.cm. The fabricated memory devices based on FeSi nanowires showed significant C-V hysteresis, exhibiting the memory effect. The strong memory effect can be accounted for by the presence of defects or dangling bonds on the surface of the FeSi nanowires embedded in the SiO(2) layer, which enhances the trapping density for nonvolatile memory applications.en_US
dc.language.isoen_USen_US
dc.titleOrientation-Dependent Room-Temperature Ferromagnetism of FeSi Nanowires and Applications in Nonvolatile Memory Devicesen_US
dc.typeArticleen_US
dc.identifier.doi10.1021/jp201395ren_US
dc.identifier.journalJOURNAL OF PHYSICAL CHEMISTRY Cen_US
dc.citation.volume115en_US
dc.citation.issue31en_US
dc.citation.spage15592en_US
dc.citation.epage15597en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000293419700060-
dc.citation.woscount8-
顯示於類別:期刊論文


文件中的檔案:

  1. 000293419700060.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。