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dc.contributor.authorPeng, Chun-Yenen_US
dc.contributor.authorLiu, Yuan-Anen_US
dc.contributor.authorWang, Wei-Linen_US
dc.contributor.authorTian, Jr-Shengen_US
dc.contributor.authorChang, Lien_US
dc.date.accessioned2014-12-08T15:28:13Z-
dc.date.available2014-12-08T15:28:13Z-
dc.date.issued2012-10-08en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4759032en_US
dc.identifier.urihttp://hdl.handle.net/11536/20432-
dc.description.abstractHere, the unambiguous effect of cooling rate on structural, electrical, and optical properties of a-plane ZnO:Al on r-plane sapphire grown by pulsed laser deposition at 700 degrees C is reported. A high cooling rate (similar to 100 degrees C/min) can result in stripe morphology along m-direction and significant deformation on the epitaxial films of a-plane ZnO:Al with deteriorated crystallinity and significantly lowered resistivity. Also, photoluminescence spectra exhibit high intensities of excess violet and green emissions with low intensity of near band edge luminescence. Comparison with pure a-plane ZnO films is also presented. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4759032]en_US
dc.language.isoen_USen_US
dc.titleThe cooling effect on structural, electrical, and optical properties of epitaxial a-plane ZnO:Al on r-plane sapphire grown by pulsed laser depositionen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.4759032en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume101en_US
dc.citation.issue15en_US
dc.citation.epageen_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000310304900036-
dc.citation.woscount3-
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