Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hsu, Bailey C. | en_US |
dc.contributor.author | Lin, Chiung-Yuan | en_US |
dc.contributor.author | Hsieh, Yau-Shian | en_US |
dc.contributor.author | Chen, Yu-Chang | en_US |
dc.date.accessioned | 2014-12-08T15:28:50Z | - |
dc.date.available | 2014-12-08T15:28:50Z | - |
dc.date.issued | 2012-12-10 | en_US |
dc.identifier.issn | 0003-6951 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.4769814 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/20836 | - |
dc.description.abstract | Recent experiments revealed that surface reconstruction occurs at around 300-400 K in the interface of C-60 adsorbed on Cu(111) substrate by scanning tunneling microscope techniques. To understand effects of such reconstruction on thermopower, we investigate the Seebeck coefficients of C-60 single-molecular junctions without and with surface reconstruction as a function of temperature at different tip-to-molecule heights from first-principles. Our calculations show that surface reconstruction can enhance or suppress Seebeck coefficients according to junctions at different tip heights. We further observe that the Seebeck coefficient of the junction at d = 3.4 angstrom may change from p- to n-type under surface reconstruction. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4769814] | en_US |
dc.language.iso | en_US | en_US |
dc.title | Tailoring thermopower of single-molecular junctions by temperature-induced surface reconstruction | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.4769814 | en_US |
dc.identifier.journal | APPLIED PHYSICS LETTERS | en_US |
dc.citation.volume | 101 | en_US |
dc.citation.issue | 24 | en_US |
dc.citation.epage | en_US | |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000312490000075 | - |
dc.citation.woscount | 5 | - |
Appears in Collections: | Articles |
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