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dc.contributor.authorZan, Hsiao-Wenen_US
dc.contributor.authorHsu, Ting-Yuen_US
dc.date.accessioned2014-12-08T15:28:55Z-
dc.date.available2014-12-08T15:28:55Z-
dc.date.issued2011-08-01en_US
dc.identifier.issn0741-3106en_US
dc.identifier.urihttp://dx.doi.org/10.1109/LED.2011.2155026en_US
dc.identifier.urihttp://hdl.handle.net/11536/20893-
dc.description.abstractThe influences of encapsulation on the hysteresis and the gate-bias-stress effects (both positive and negative gate bias stresses) of pentacene organic thin-film transistors (OTFTs) with poly(4-vinylphenol) and poly(4-vinylphenol-co-methyl methacrylate) (PVP-PMMA) gate dielectrics are investigated. The encapsulation and the use of less polar gate dielectrics like PVP-PMMA copolymers are both important to suppress moisture adsorption and to obtain a stable pentacene OTFT. Compared to the air-stable OTFT with a fluoropolymer dielectric, the stable encapsulated OTFT with a PVP-PMMA dielectric is a low-cost promising candidate for mass production consideration.en_US
dc.language.isoen_USen_US
dc.subjectBias stressen_US
dc.subjectpentaceneen_US
dc.subjectpoly(4-vinylphenol-co-methyl methacrylate) (PVP-PMMA)en_US
dc.subjectreliabilityen_US
dc.subjectthin-film transistoren_US
dc.titleStable Encapsulated Organic TFT With a Spin-Coated Poly(4-Vinylphenol-Co-Methyl Methacrylate) Dielectricen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/LED.2011.2155026en_US
dc.identifier.journalIEEE ELECTRON DEVICE LETTERSen_US
dc.citation.volume32en_US
dc.citation.issue8en_US
dc.citation.spage1131en_US
dc.citation.epage1133en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000293710400046-
dc.citation.woscount7-
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