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dc.contributor.authorWang, Sheng-Yaen_US
dc.contributor.authorLiao, Wei-Hsiangen_US
dc.contributor.authorYang, Kei-Hsiungen_US
dc.date.accessioned2014-12-08T15:29:01Z-
dc.date.available2014-12-08T15:29:01Z-
dc.date.issued2012-10-01en_US
dc.identifier.issn0141-9382en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.displa.2012.08.002en_US
dc.identifier.urihttp://hdl.handle.net/11536/20932-
dc.description.abstractWe have utilized a transmission ratio (TR) between curtain-shaped (Curtain) Mura and non-Mura zones as a key parameter to characterize the optical appearance of Curtain Mura occurred on a 13.3-in TFT-TN panel (Mura sample) after bonding process to place silicon-based driver-IC chips on one of the panel substrates using anisotropic conductive film as a binder (COG ACF process). Our measured TRs of the Mura sample at zero applied voltage were in good agreement with calculated TRs using optical parameters of the Mura sample derived from the measured Stokes parameters of the liquid crystal (LC) medium in that sample. We conclude that the occurrence of Curtain Mura is dominant by the stress-induced change in the twist angle, less sensitive and insensitive to the corresponding induced changes in the cell gap and pretilt angle of the in-panel-LC medium, respectively. By simulation, we also point out a way to reduce the occurrence of Curtain Mura by designing the cell gap for a 90 degrees-twsit TN panel to satisfy the condition of Gooch-Terry first minimum. (C) 2012 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectLiquid crystal displaysen_US
dc.subjectCurtain Muraen_US
dc.subjectLCD optical simulationen_US
dc.subjectThin film circuit bondingen_US
dc.subjectLCD packageen_US
dc.titleInvestigation of Curtain Mura in TFT-TN panels after COG ACF processen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.displa.2012.08.002en_US
dc.identifier.journalDISPLAYSen_US
dc.citation.volume33en_US
dc.citation.issue4-5en_US
dc.citation.spage173en_US
dc.citation.epage177en_US
dc.contributor.department光電系統研究所zh_TW
dc.contributor.department影像與生醫光電研究所zh_TW
dc.contributor.departmentInstitute of Photonic Systemen_US
dc.contributor.departmentInstitute of Imaging and Biomedical Photonicsen_US
dc.identifier.wosnumberWOS:000313849300001-
dc.citation.woscount0-
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