Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wu, Chi-Chang | en_US |
dc.contributor.author | Tsai, Yi-Jen | en_US |
dc.contributor.author | Liu, Pin-Lin | en_US |
dc.contributor.author | Yang, Wen-Luh | en_US |
dc.contributor.author | Ko, Fu-Hsiang | en_US |
dc.date.accessioned | 2014-12-08T15:29:14Z | - |
dc.date.available | 2014-12-08T15:29:14Z | - |
dc.date.issued | 2013-01-01 | en_US |
dc.identifier.issn | 0957-4522 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1007/s10854-012-0773-y | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/21079 | - |
dc.description.abstract | A promising charge trapping film with crystal embedded material is proposed for future electronic devices. Instead of conventional high-vacuum and expensive tool, this technique adopts very cheaper process of sol-gel spin-coating for fabrication of thin film material in the charge trapping flash memory (CTFM). The crystal from spinodal phase separation is observed for sol-gel thin film at 900 degrees C annealing, and is strongly related to the thickness of the spin-coated thin film. The morphology of the crystal from the ethanol solvent system is in the isolated form, while from 2-propanol solvent is in the interconnected structure. The sol-gel-derived CTFM from ethanol exhibits the better memory performance of retention times for <5 and <10 % charge loss at applied temperature of 25 and 85 degrees C, respectively. The ethanol system CTFM demonstrates a large memory window (similar to 10 V) and good reliability than 2-propanol (similar to 3 V) due to the existence of several isolated crystals in silicon dioxide film. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Facile sol-gel preparation of nanocrystal embedded thin film material for memory device | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1007/s10854-012-0773-y | en_US |
dc.identifier.journal | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | en_US |
dc.citation.volume | 24 | en_US |
dc.citation.issue | 1 | en_US |
dc.citation.spage | 423 | en_US |
dc.citation.epage | 430 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000313799400060 | - |
dc.citation.woscount | 2 | - |
Appears in Collections: | Articles |
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