Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chen, Shi-Hao | en_US |
dc.contributor.author | Lin, Youn-Long | en_US |
dc.contributor.author | Chao, Mango C. -T. | en_US |
dc.date.accessioned | 2014-12-08T15:29:24Z | - |
dc.date.available | 2014-12-08T15:29:24Z | - |
dc.date.issued | 2013-03-01 | en_US |
dc.identifier.issn | 1063-8210 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TVLSI.2012.2187689 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/21178 | - |
dc.description.abstract | Power gating is effective for reducing standby leakage power asmulti-thresholdCMOS(MTCMOS) designs have become popular in the industry. However, a large inrush current and dynamic IR drop may occur when a circuit domain is powered up with MTCMOS switches. This could in turn lead to improper circuit operation. We propose a novel framework for generating a proper power-up sequence of the switches to control the inrush current of a power-gated domain while minimizing the power-up time and reducing the dynamic IR drop of the active domains. We also propose a configurable domino-delay circuit for implementing the sequence. Experimental results based on state-of-the-art industrial designs demonstrate the effectiveness of the proposed framework in limiting the inrush current, minimizing the power-up time, and reducing the dynamic IR drop. Results further confirm the efficiency of the framework in handling large-scale designs with more than 80 K power switches and 100 M transistors. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Dynamic IR | en_US |
dc.subject | inrush current | en_US |
dc.subject | low power design | en_US |
dc.subject | multi-threshold CMOS (MTCMOS) | en_US |
dc.subject | power gating | en_US |
dc.subject | power-up sequence | en_US |
dc.subject | ramp-up time | en_US |
dc.title | Power-Up Sequence Control for MTCMOS Designs | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TVLSI.2012.2187689 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | en_US |
dc.citation.volume | 21 | en_US |
dc.citation.issue | 3 | en_US |
dc.citation.spage | 413 | en_US |
dc.citation.epage | 423 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000315639900002 | - |
dc.citation.woscount | 0 | - |
Appears in Collections: | Articles |
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