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dc.contributor.authorChen, Shi-Haoen_US
dc.contributor.authorLin, Youn-Longen_US
dc.contributor.authorChao, Mango C. -T.en_US
dc.date.accessioned2014-12-08T15:29:24Z-
dc.date.available2014-12-08T15:29:24Z-
dc.date.issued2013-03-01en_US
dc.identifier.issn1063-8210en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TVLSI.2012.2187689en_US
dc.identifier.urihttp://hdl.handle.net/11536/21178-
dc.description.abstractPower gating is effective for reducing standby leakage power asmulti-thresholdCMOS(MTCMOS) designs have become popular in the industry. However, a large inrush current and dynamic IR drop may occur when a circuit domain is powered up with MTCMOS switches. This could in turn lead to improper circuit operation. We propose a novel framework for generating a proper power-up sequence of the switches to control the inrush current of a power-gated domain while minimizing the power-up time and reducing the dynamic IR drop of the active domains. We also propose a configurable domino-delay circuit for implementing the sequence. Experimental results based on state-of-the-art industrial designs demonstrate the effectiveness of the proposed framework in limiting the inrush current, minimizing the power-up time, and reducing the dynamic IR drop. Results further confirm the efficiency of the framework in handling large-scale designs with more than 80 K power switches and 100 M transistors.en_US
dc.language.isoen_USen_US
dc.subjectDynamic IRen_US
dc.subjectinrush currenten_US
dc.subjectlow power designen_US
dc.subjectmulti-threshold CMOS (MTCMOS)en_US
dc.subjectpower gatingen_US
dc.subjectpower-up sequenceen_US
dc.subjectramp-up timeen_US
dc.titlePower-Up Sequence Control for MTCMOS Designsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TVLSI.2012.2187689en_US
dc.identifier.journalIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMSen_US
dc.citation.volume21en_US
dc.citation.issue3en_US
dc.citation.spage413en_US
dc.citation.epage423en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000315639900002-
dc.citation.woscount0-
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