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dc.contributor.authorLin, Yong-Hanen_US
dc.contributor.authorWang, Lu-Yaoen_US
dc.contributor.authorLin, Juhn-Jongen_US
dc.date.accessioned2014-12-08T15:29:39Z-
dc.date.available2014-12-08T15:29:39Z-
dc.date.issued2012-12-13en_US
dc.identifier.issn1931-7573en_US
dc.identifier.urihttp://dx.doi.org/10.1186/1556-276X-7-673en_US
dc.identifier.urihttp://hdl.handle.net/11536/21299-
dc.description.abstractSingle-crystalline iridium dioxide nanowires show the time-dependent universal conductance fluctuations (TUCFs) at cryogenic temperatures. The conductance fluctuations persist up to temperature T as high as nearly 10 K. The root-mean-square TUCF magnitudes increase with decreasing T, reaching approximately 0.1 e (2) / h at 1.7 K. We ascribe these conductance fluctuations to originating from the conduction electrons scattering upon mobile defects (moving scattering centers). Our measured TUCF characteristics are satisfactorily explained in terms of the existing TUCF theory in its three-dimensional form. The extracted electron dephasing length L (phi) (1.7 K) a parts per thousand integral 90 nm is smaller than the diameter (a parts per thousand 180 nm) of our nanowires.en_US
dc.language.isoen_USen_US
dc.subjectQuantum-interference effecten_US
dc.subjectUniversal conductance fluctuationen_US
dc.subjectMobile defecten_US
dc.subjectIridium dioxide nanowireen_US
dc.subjectRutile structureen_US
dc.titleTime-dependent universal conductance fluctuations in IrO2 nanowiresen_US
dc.typeArticleen_US
dc.identifier.doi10.1186/1556-276X-7-673en_US
dc.identifier.journalNANOSCALE RESEARCH LETTERSen_US
dc.citation.volume7en_US
dc.citation.issueen_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department物理研究所zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentInstitute of Physicsen_US
dc.identifier.wosnumberWOS:000315442400001-
dc.citation.woscount0-
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