完整後設資料紀錄
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dc.contributor.authorChen, Kuo-Juen_US
dc.contributor.authorKuo, Hsuan-Tingen_US
dc.contributor.authorChen, Hsin-Chuen_US
dc.contributor.authorShih, Min-Hsiungen_US
dc.contributor.authorWang, Chao-Hsunen_US
dc.contributor.authorChien, Shih-Hsuanen_US
dc.contributor.authorChiu, Sheng Huanen_US
dc.contributor.authorLin, Chien-Chungen_US
dc.contributor.authorPan, Ching-Jenen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.date.accessioned2019-04-03T06:43:02Z-
dc.date.available2019-04-03T06:43:02Z-
dc.date.issued2013-03-11en_US
dc.identifier.issn1094-4087en_US
dc.identifier.urihttp://dx.doi.org/10.1364/OE.21.00A201en_US
dc.identifier.urihttp://hdl.handle.net/11536/21388-
dc.description.abstractThis study experimentally and numerically examines the correlated color temperature (CCT) stability issue for hybrid warm white high-voltage light-emitting diodes (HV-LEDs) by using a current compensation method. This method could efficiently maintain the CCT stability factor at approximately 1.0 and yield greater color uniformity with Delta u'v' values ranging from 0.017 to 0.003 in CIE 1976 chromaticity coordinates. The simulation results show that the red chip intensity drop is the primary cause of CCT instability in the hybrid warm white system when the temperature increases. Therefore, Furthermore, results indicate that the relative lumen drop improves from 21% to 15% by using a current compensation method. (c) 2013 Optical Society of Americaen_US
dc.language.isoen_USen_US
dc.titleHigh thermal stability of correlated color temperature using current compensation in hybrid warm white high-voltage LEDsen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/OE.21.00A201en_US
dc.identifier.journalOPTICS EXPRESSen_US
dc.citation.volume21en_US
dc.citation.issue5en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department光電系統研究所zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.department光電工程研究所zh_TW
dc.contributor.departmentInstitute of Photonic Systemen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.contributor.departmentInstitute of EO Enginerringen_US
dc.identifier.wosnumberWOS:000316103300001en_US
dc.citation.woscount8en_US
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