完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Farber, E. | en_US |
dc.contributor.author | Bachar, N. | en_US |
dc.contributor.author | Lavi, D. | en_US |
dc.contributor.author | Castro, H. | en_US |
dc.contributor.author | Chen, Y. -J. | en_US |
dc.contributor.author | Wu, K. H. | en_US |
dc.contributor.author | Juang, J. Y. | en_US |
dc.date.accessioned | 2014-12-08T15:30:02Z | - |
dc.date.available | 2014-12-08T15:30:02Z | - |
dc.date.issued | 2013-04-01 | en_US |
dc.identifier.issn | 1557-1939 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1007/s10948-012-2002-6 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/21507 | - |
dc.description.abstract | The surface impedance of Y0.9Ca0.1Ba2Cu3O7-delta thin films was measured using the Corbino spectroscopy method. This special geometry, in which the sample dimensions are well defined by a ring pattern, is ideal for broadband high frequency reflection measurements. Using the complex reflected signal, S (11), measured by a vector network analyzer, one can find the surface impedance of the thin film, from which the complex conductivity can be deduced. In the current work we present the three-standard approach for calibration of the Corbino method and demonstrate the benefits of this approach in measuring superconducting Y0.9Ca0.1Ba2Cu3O7-delta thin films up to 20 GHz and down to 6 K. For the data analysis the well-known generalized two-fluid model was implemented, taking into account a film thickness which is much smaller than the normal state skin depth and superconducting penetration depth. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Superconductor | en_US |
dc.subject | Microwave | en_US |
dc.subject | Corbino | en_US |
dc.title | Broadband Microwave Measurements of Overdoped Y0.9Ca0.1Ba2Cu3O7-delta Films Using Corbino Geometry | en_US |
dc.type | Article; Proceedings Paper | en_US |
dc.identifier.doi | 10.1007/s10948-012-2002-6 | en_US |
dc.identifier.journal | JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM | en_US |
dc.citation.volume | 26 | en_US |
dc.citation.issue | 4 | en_US |
dc.citation.spage | 1111 | en_US |
dc.citation.epage | 1114 | en_US |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.identifier.wosnumber | WOS:000317014500069 | - |
顯示於類別: | 會議論文 |