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dc.contributor.authorWu, Tzeng-Tsongen_US
dc.contributor.authorChen, Chih-Chengen_US
dc.contributor.authorChen, Hao-Wenen_US
dc.contributor.authorLu, Tien-Changen_US
dc.contributor.authorWang, Shing-Chungen_US
dc.contributor.authorKuo, Cheng-Huangen_US
dc.date.accessioned2014-12-08T15:30:07Z-
dc.date.available2014-12-08T15:30:07Z-
dc.date.issued2012en_US
dc.identifier.isbn978-1-4577-0828-2en_US
dc.identifier.issn2326-5442en_US
dc.identifier.urihttp://hdl.handle.net/11536/21591-
dc.description.abstractGaN-based bottom-up photonic quasicrystal (PQC) lasers were realized and characterized. Photonic quasicrystal nanopillars were realized by nanoimprint technique and selective area growth. Highly localized mode was identified for the first time in GaN-based PQC lasers. (C) 2012 Optical Society of Americaen_US
dc.language.isoen_USen_US
dc.titleMode Localization in Defect-free GaN-based Bottom-up Photonic Quasicrystal Lasersen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2012 23RD IEEE INTERNATIONAL SEMICONDUCTOR LASER CONFERENCE (ISLC)en_US
dc.citation.spage171en_US
dc.citation.epage172en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000316820100086-
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