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dc.contributor.authorKuo, Kuang-Yangen_US
dc.contributor.authorHuang, Pin-Rueien_US
dc.contributor.authorLee, Po-Tsungen_US
dc.date.accessioned2014-12-08T15:30:12Z-
dc.date.available2014-12-08T15:30:12Z-
dc.date.issued2013-05-17en_US
dc.identifier.issn0957-4484en_US
dc.identifier.urihttp://dx.doi.org/10.1088/0957-4484/24/19/195701en_US
dc.identifier.urihttp://hdl.handle.net/11536/21642-
dc.description.abstractA gradient Si-rich oxide multilayer (GSRO-ML) deposition structure is proposed to achieve super-high density Si quantum dot (QD) thin film formation while preserving QD size controllability for better photovoltaic properties. Our results indicate that the Si QD thin film using a GSRO-ML structure can efficiently increase the QD density and control the QD size. Its optical properties clearly promise the capability of effective bandgap engineering even though these QDs are closely formed. The Si QD thin film using a GSRO-ML structure obviously reveals better electro-optical properties than those using a [silicon dioxide/silicon-rich oxide] multilayer ([SiO2/SRO]-ML) structure owing to the better optical absorption and carrier transport properties. Therefore, we successfully demonstrate that our proposed GSRO-ML structure has great potential for application in solar cells integrating Si QD thin films.en_US
dc.language.isoen_USen_US
dc.titleSuper-high density Si quantum dot thin film utilizing a gradient Si-rich oxide multilayer structureen_US
dc.typeArticleen_US
dc.identifier.doi10.1088/0957-4484/24/19/195701en_US
dc.identifier.journalNANOTECHNOLOGYen_US
dc.citation.volume24en_US
dc.citation.issue19en_US
dc.citation.epageen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000317955400014-
dc.citation.woscount7-
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