完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Kang, Ting-Ting | en_US |
dc.contributor.author | Komiyama, Susumu | en_US |
dc.contributor.author | Ueda, Takeji | en_US |
dc.contributor.author | Lin, Shi-Wei | en_US |
dc.contributor.author | Lin, Sheng-Di | en_US |
dc.date.accessioned | 2014-12-08T15:30:27Z | - |
dc.date.available | 2014-12-08T15:30:27Z | - |
dc.date.issued | 2013-01-01 | en_US |
dc.identifier.issn | 1077-260X | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/JSTQE.2012.2191767 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/21773 | - |
dc.description.abstract | For charge-sensitive infrared phototransistors (CSIP), it is observed that "conductance decrease," which is contrary to the standard "conductance increase" photon response, can also happen after absorbing infrared light. By experimental modeling the charge-up detection mechanism of CSIP via a capacitive way, we clarify that " conductance decrease" should be attributed to the significantly reduced low quantum well electron mobility after the photon-charging process, rather than a reversed electron transfer. This experimental result clearly indicates that photon-induced charges are able to modify the electron mobility in those "charge-sensitive sensor" types of semiconductor quantum single-photon detectors. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Charge | en_US |
dc.subject | detector | en_US |
dc.subject | double quantum well | en_US |
dc.subject | infrared | en_US |
dc.subject | mobility | en_US |
dc.subject | phototransistor | en_US |
dc.title | An Anomalous Conductance Decrease in Charge Sensitive Infrared Phototransistor | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/JSTQE.2012.2191767 | en_US |
dc.identifier.journal | IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS | en_US |
dc.citation.volume | 19 | en_US |
dc.citation.issue | 1 | en_US |
dc.citation.epage | en_US | |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000317779700022 | - |
dc.citation.woscount | 0 | - |
顯示於類別: | 期刊論文 |