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dc.contributor.authorKo, Tin Yuen_US
dc.contributor.authorLiu, Yu Linen_US
dc.contributor.authorSun, Kien Wenen_US
dc.contributor.authorLin, Yi Jieen_US
dc.contributor.authorFong, Shih-Chiehen_US
dc.contributor.authorLin, I. Nanen_US
dc.contributor.authorTai, Nyan Hwaen_US
dc.date.accessioned2014-12-08T15:30:40Z-
dc.date.available2014-12-08T15:30:40Z-
dc.date.issued2013-05-01en_US
dc.identifier.issn0925-9635en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.diamond.2013.03.009en_US
dc.identifier.urihttp://hdl.handle.net/11536/21898-
dc.description.abstractRaman, photoluminescence, and transport properties of nitrogen-doped ultrananocrystal diamond (UNCD) films were investigated following treatment with low energy microwave plasma at room temperature. The conductivity of nitrogen-doped UNCD films treated by microwave plasma was found to decrease slightly due to the reduced grain boundaries. We speculate that the plasma generated vacancies in UNCD films and provided heat for further mobilizing the vacancies to combine with the impurities, which led to the formation of the silicon-vacancy (Si-V) and nitrogen-vacancy (N-V) defect centers. The generated color centers were found to be distributed uniformly in the samples using all mapping technique. The PL emitted by the plasma treated nitrogen-doped UNCD film was strongly enhanced in comparison with the untreated films. (C) 2013 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectUltrananocrystalline diamonden_US
dc.subjectNitrogen vacancyen_US
dc.subjectPlasmaen_US
dc.subjectPhotoluminescenceen_US
dc.subjectColor centeren_US
dc.titleStrong photoluminescence from N-V and Si-V in nitrogen-doped ultrananocrystalline diamond film using plasma treatmenten_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.diamond.2013.03.009en_US
dc.identifier.journalDIAMOND AND RELATED MATERIALSen_US
dc.citation.volume35en_US
dc.citation.issueen_US
dc.citation.spage36en_US
dc.citation.epage39en_US
dc.contributor.department應用化學系zh_TW
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.identifier.wosnumberWOS:000319177700007-
dc.citation.woscount0-
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