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dc.contributor.authorLo, Shun-Tsungen_US
dc.contributor.authorWang, Yi-Tingen_US
dc.contributor.authorLin, Sheng-Dien_US
dc.contributor.authorStrasser, Gottfrieden_US
dc.contributor.authorBird, Jonathan P.en_US
dc.contributor.authorChen, Yang-Fangen_US
dc.contributor.authorLiang, Chi-Teen_US
dc.date.accessioned2014-12-08T15:31:12Z-
dc.date.available2014-12-08T15:31:12Z-
dc.date.issued2013-07-03en_US
dc.identifier.issn1931-7573en_US
dc.identifier.urihttp://dx.doi.org/10.1186/1556-276X-8-307en_US
dc.identifier.urihttp://hdl.handle.net/11536/22211-
dc.description.abstractWe have performed low-temperature measurements on a gated two-dimensional electron system in which electron-electron (e-e) interactions are insignificant. At low magnetic fields, disorder-driven movement of the crossing of longitudinal and Hall resistivities (rho (xx) and rho (xy)) can be observed. Interestingly, by applying different gate voltages, we demonstrate that such a crossing at rho (xx) similar to rho (xy) can occur at a magnetic field higher, lower, or equal to the temperature-independent point in rho (xx) which corresponds to the direct insulator-quantum Hall transition. We explicitly show that rho (xx) similar to rho (xy) occurs at the inverse of the classical Drude mobility 1/mu (D) rather than the crossing field corresponding to the insulator-quantum Hall transition. Moreover, we show that the background magnetoresistance can affect the transport properties of our device significantly. Thus, we suggest that great care must be taken when calculating the renormalized mobility caused by e-e interactions.en_US
dc.language.isoen_USen_US
dc.subjectHall effecten_US
dc.subjectMagnetoresistanceen_US
dc.subjectElectronsen_US
dc.subjectDirect insulator-quantum hall transitionen_US
dc.titleTunable insulator-quantum Hall transition in a weakly interacting two-dimensional electron systemen_US
dc.typeArticleen_US
dc.identifier.doi10.1186/1556-276X-8-307en_US
dc.identifier.journalNANOSCALE RESEARCH LETTERSen_US
dc.citation.volume8en_US
dc.citation.issueen_US
dc.citation.epageen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000322020200001-
dc.citation.woscount1-
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