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dc.contributor.authorCheng, Hui-Wenen_US
dc.contributor.authorChang, Yuan-Chihen_US
dc.contributor.authorYuan, Chi-Tsuen_US
dc.contributor.authorTang, Song-Nienen_US
dc.contributor.authorChang, Chia-Sengen_US
dc.contributor.authorTang, Jauen_US
dc.contributor.authorChen, Fu-Rongen_US
dc.contributor.authorPan, Rong-Longen_US
dc.contributor.authorTseng, Fan-Gangen_US
dc.date.accessioned2014-12-08T15:31:21Z-
dc.date.available2014-12-08T15:31:21Z-
dc.date.issued2013-06-27en_US
dc.identifier.issn1932-7447en_US
dc.identifier.urihttp://dx.doi.org/10.1021/jp401050ten_US
dc.identifier.urihttp://hdl.handle.net/11536/22273-
dc.description.abstractThis paper introduces a simple, yet controllable scheme to pick up a single 13 nm Au nanoparticle (Au-NP) using the tip of an atomic force microscope (AFM) probe through the application of electrical biases between the tip and the Au-NP. Transmission electron microscope (TEM) images were acquired to verify that a single Au-NP was attached to the AFM probe. We postulate that the mechanism underlying the ability to manipulate individual Au-NPs at the apex of the AFM probe tip is Coulomb interaction induced by tip bias. The AFM tip with the attached Au-NP was then used to study the interaction between a single quantum dot (QD) and the Au-NP. The blinking behavior of single colloidal CdSe/ZnS core/shell QD was significantly suppressed with the approach of the 13 nm Au-NP attached to the AFM tip.en_US
dc.language.isoen_USen_US
dc.titleSimple and Fast Method To Fabricate Single-Nanoparticle-Terminated Atomic Force Microscope Tipsen_US
dc.typeArticleen_US
dc.identifier.doi10.1021/jp401050ten_US
dc.identifier.journalJOURNAL OF PHYSICAL CHEMISTRY Cen_US
dc.citation.volume117en_US
dc.citation.issue25en_US
dc.citation.spage13239en_US
dc.citation.epage13246en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000321236400038-
dc.citation.woscount0-
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