Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chien, Yun-Shan | en_US |
dc.contributor.author | Lee, I-Che | en_US |
dc.contributor.author | Yang, Po-Yu | en_US |
dc.contributor.author | Wang, Chao-Lung | en_US |
dc.contributor.author | Tsai, Wan-Lin | en_US |
dc.contributor.author | Wang, Kuang-Yu | en_US |
dc.contributor.author | Chou, Chia-Hsin | en_US |
dc.contributor.author | Cheng, Huang-Chung | en_US |
dc.date.accessioned | 2014-12-08T15:31:32Z | - |
dc.date.available | 2014-12-08T15:31:32Z | - |
dc.date.issued | 2013-05-06 | en_US |
dc.identifier.issn | 0003-6951 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.4804292 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/22366 | - |
dc.description.abstract | In this paper, the surface morphology transformation of the sprayed carbon nanotube (CNT) thin film irradiated with the excimer laser has been systematically investigated. Under the excimer-laser irradiation, two phenomena, including the annealing and ablation effects, were found to be dependent on the incident laser energy and overlapping ratios. Moreover, the extremely high protrusions would be produced in the interface between the annealing and ablation regions. The mechanism of the CNT thin film under the excimer laser irradiation was, therefore, proposed to derive the surface morphology modifications and the further reinforced crystallinity with proper laser energy densities and overlapping ratios. (C) 2013 AIP Publishing LLC. | en_US |
dc.language.iso | en_US | en_US |
dc.title | The mechanism of the surface morphology transformation for the carbon nanotube thin film irradiated via excimer laser | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.4804292 | en_US |
dc.identifier.journal | APPLIED PHYSICS LETTERS | en_US |
dc.citation.volume | 102 | en_US |
dc.citation.issue | 18 | en_US |
dc.citation.epage | en_US | |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000320439900066 | - |
dc.citation.woscount | 1 | - |
Appears in Collections: | Articles |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.