統計資料
總造訪次數
| 檢視 | |
|---|---|
| Analysis of Electrical Characteristics and Reliability Change of Zinc-Tin-Oxide Thin-Film Transistors by Photo-Thermal Treatment | 115 |
本月總瀏覽
| 七月 2025 | 八月 2025 | 九月 2025 | 十月 2025 | 十一月 2025 | 十二月 2025 | 一月 2026 | |
|---|---|---|---|---|---|---|---|
| Analysis of Electrical Characteristics and Reliability Change of Zinc-Tin-Oxide Thin-Film Transistors by Photo-Thermal Treatment | 0 | 0 | 0 | 0 | 3 | 3 | 1 |
檔案下載
| 檢視 | |
|---|---|
| 000321740400010.pdf | 6 |
國家瀏覽排行
| 檢視 | |
|---|---|
| 中國 | 95 |
| 美國 | 17 |
縣市瀏覽排行
| 檢視 | |
|---|---|
| Shenzhen | 95 |
| Menlo Park | 8 |
| Kensington | 3 |
| Buffalo | 2 |
| Ashburn | 1 |
| Edmond | 1 |
| Wilmington | 1 |