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dc.contributor.authorLiao, Yu-Kuangen_US
dc.contributor.authorWang, Yi-Chungen_US
dc.contributor.authorYen, Yu-Tingen_US
dc.contributor.authorChen, Chia-Hsiangen_US
dc.contributor.authorHsieh, Dan-Huaen_US
dc.contributor.authorChen, Shih-Chenen_US
dc.contributor.authorLee, Chia-Yuen_US
dc.contributor.authorLai, Chih-Chungen_US
dc.contributor.authorKuo, Wei-Chenen_US
dc.contributor.authorJuang, Jenh-Yien_US
dc.contributor.authorWu, Kaung-Hsiungen_US
dc.contributor.authorCheng, Shun-Jenen_US
dc.contributor.authorLai, Chih-Huangen_US
dc.contributor.authorLai, Fang-Ien_US
dc.contributor.authorKuo, Shou-Yien_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.contributor.authorChueh, Yu-Lunen_US
dc.date.accessioned2014-12-08T15:31:56Z-
dc.date.available2014-12-08T15:31:56Z-
dc.date.issued2013-08-01en_US
dc.identifier.issn1936-0851en_US
dc.identifier.urihttp://dx.doi.org/10.1021/nn402976ben_US
dc.identifier.urihttp://hdl.handle.net/11536/22569-
dc.description.abstractWe present systematic works in characterization of CIGS nanotip arrays (CIGS NTRs). CIGS NTRs are obtained by a one-step ion-milling process by a direct-sputtering process of CIGS thin films (CIGS TF) without a postselenization process. At the surface of CIGS NTRs, a region extending to 100 nm in depth with a lower copper concentration compared to that of CIGS TF has been discovered. After KCN washing, removal of secondary phases can be achieved and a layer with abundant copper vacancy (V-Cu) was left. Such compositional changes can be a benefit for a CIGS solar cell by promoting formation of Cd-occupied Cu sites (Cd-Cu) at the CdS/CIGS interface and creates a type-inversion layer to enhance interface passivation and carrier extraction. The raised V-Cu concentration and enhanced Cd diffusion in CIGS NTRs have been verified by energy dispersive spectrometry. Strengthened adhesion of Al:ZnO (AZO) thin film on CIGS NTRs capped with CdS has also been observed in SEM images and can explain the suppressed series resistance of the device with CIGS NTRs. Those improvements in electrical characteristics are the main factors for efficiency enhancement rather than antireflection.en_US
dc.language.isoen_USen_US
dc.subjectCIGS solar cellen_US
dc.subjectdirect sputteringen_US
dc.subjectnanotip arraysen_US
dc.subjectcopper vacancyen_US
dc.subjectCd diffusionen_US
dc.titleNon-antireflective Scheme for Efficiency Enhancement of Cu(In,Ga)Se-2 Nanotip Array Solar Cellsen_US
dc.typeArticleen_US
dc.identifier.doi10.1021/nn402976ben_US
dc.identifier.journalACS NANOen_US
dc.citation.volume7en_US
dc.citation.issue8en_US
dc.citation.spage7318en_US
dc.citation.epage7329en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000323810600098-
dc.citation.woscount6-
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